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Daegu
AVSS 2023

S.KOREA

The 19th International Conference on Advanced Video and Signal-Based Surveillance Nov 6 - 9, 2023

Calls

Calls For Papers

19th IEEE Int. Conf. on Advanced Video and Signal-Based Surveillance

Both at EXCO Convention Center, Daegu, South Korea and virtually.

6 (Mon.) ~ 9 (Thur.), November, 2023

AVSS 2023 is the 19th edition of the IEEE International Conference on Advanced Video and Signal-Based Surveillance, a premier forum for the presentation of new advances and research results in the field of video and signal-based surveillance. AVSS 2023 is sponsored by the IEEE Signal Processing Society.

AVSS 2023 will be a hybrid conference, with both in-person and virtual attendance options. Conference content hosted on the virtual platform will be available exclusively to AVSS registered attendees.

*Each accepted paper MUST be registered under a full, in-person registration type. (Student registration type is fine)

Important Dates

Paper Submission

July 17, 2023

June 14, 2023
Decision to Authors August 28, 2023
Camera Ready September 4, 2023
Workshop Proposals May 1, 2023
Challenge Proposals May 1, 2023

Topics of Interest

AVSS is the leading conference venue for the underlying theory, methods, systems, and applications of video and signal processing, security and privacy, and applications of machine learning to video processing and image understanding. AVSS encourages submissions on cross-disciplinary and game-changing subjects. Topics of interest include, but are not limited to

Real-time Video Processing

Model Security, Privacy and Robustness

Multi-modal Analytics

Multi-camera Video Analytics

Surveillance Systems and Applications

Prospective authors are invited to submit high-quality full papers representing original results in all areas of video and signal-based surveillance. Submissions and final papers are limited to eight pages in double-column IEEE format, including figures, tables, and references. Accepted papers are published in the conference proceedings that will be also available in the IEEE Xplore digital library.

Sponsors

IEEE SPS